0
Cart
Get A Quote

CY11158 Titanium Nitride (TiN) Coated Glass

Catalog No
CY11158
Material
TiN, Borosilicate Glass
Purity
TiN: ≥99.995%
Form
Substrate

Titanium Nitride (TiN) Coated Glass is a borosilicate glass substrate coated with a uniform TiN thin film using controlled physical vapor deposition (PVD). Stanford Electronics employs precise film thickness control and surface inspection methods, including atomic force microscopy (AFM) and optical analysis, to ensure coating uniformity and integrity. This disciplined production approach minimizes surface defects and variability, making the substrate suitable for semiconductor raw material applications that demand stable, repeatable surface properties.

INQUIRY
CY11158 Titanium Nitride (TiN) Coated Glass
CY11158 Titanium Nitride (TiN) Coated Glass
Description
Specifications
Reviews
FAQ
CY11158 Titanium Nitride (TiN) Coated Glass Description

Titanium Nitride (TiN) Coated Glass Description

Titanium Nitride (TiN) Coated Glass consists of a dense, metallic TiN layer deposited onto a glass substrate to enhance chemical resistance, surface stability, and process reliability. The controlled PVD process ensures minimal surface variation and consistent coating thickness, which are essential for semiconductor environments where contamination control and interface uniformity are critical.

Titanium Nitride (TiN) Coated Glass Characteristics

Parameter Value
Material TiN, Borosilicate Glass
Purity TiN: ≥99.995%
Form Substrate
Dimensions 25 × 75 × 1 mm
Adhesion Layer None (available upon request)
TiN Thickness 500 Å
Coating Area Single size (or customized)

The above product information is based on theoretical data and is for reference only. Actual specifications may vary.

Titanium Nitride (TiN) Coated Glass Applications

Electronics and Optics

  • Used as a functional barrier layer to limit metal diffusion due to TiN’s chemical inertness.

  • Applied in optical assemblies where controlled reflectivity and smooth surface finish help reduce light scatter.

Semiconductor Manufacturing

  • Utilized in photolithography and deposition systems to improve process consistency by minimizing substrate-related variability.

  • Employed where a clean, stable glass interface is required for thin film development and device fabrication.

Titanium Nitride (TiN) Coated Glass Packaging

Substrates are packaged in static-shielding bags with cushioned supports to prevent mechanical damage and particulate contamination. Moisture-barrier sealing and controlled storage conditions are used to preserve coating integrity during transport. Customized packaging and labeling options are available upon request.

Additional Information

TiN-coated glass substrates provide an effective solution for semiconductor processes that require durable, chemically inert surfaces. Advances in PVD coating technologies enable tighter control over film thickness and surface quality, directly supporting high-precision manufacturing. The combination of borosilicate glass and TiN thin films reflects the growing role of engineered substrates in modern electronic materials processing.

CY11158 Titanium Nitride (TiN) Coated Glass Specifications

Parameter

Value

Material

TiN, Silicon Wafer

Purity

TiN: ≥99.995%

Form

Substrate

Dimensions

25*75*1 mm

Adhesion Layer

None (available upon request)

TiN Thickness

500 Å

Coating Area

Single Size (or customized)

*The above product information is based on theoretical data and is for reference only. Actual specifications may vary.

Customer Reviews Write a review
0
(0 Reviews)
5 Stars
0
4 Stars
0
3 Stars
0
2 Stars
0
1 Stars
0
No reviews for current products.
FAQ
Which parameters are critical during TiN deposition on glass?

Deposition rate, chamber pressure, and substrate temperature are tightly controlled to achieve uniform film thickness and minimize defects affecting optical and electrical behavior.

How does the TiN coating improve thermal stability?

The TiN layer acts as a protective barrier, reducing contamination and mitigating thermal stress effects during high-temperature semiconductor processes.

How is TiN coating integrity verified?

AFM, ellipsometry, and optical inspection are used to evaluate film thickness, surface roughness, and uniformity to ensure compliance with semiconductor material requirements.

Get A Quote
Send us an inquiry now to find out more information and the latest prices, thanks!
Product Name
Your Name
Your Phone
Your Email
Country
United States
  • United States
  • Afghanistan
  • Aland Islands
  • Albania
  • Algeria
  • American Samoa
  • Andorra
  • Angola
  • Anguilla
  • Antarctica
  • Antigua and Barbuda
  • Argentina
  • Armenia
  • Aruba
  • Australia
  • Austria
  • Azerbaijan
  • Bahamas
  • Bahrain
  • Bangladesh
  • Barbados
  • Belarus
  • Belgium
  • Belize
  • Benin
  • Bermuda
  • Bhutan
  • Bolivia
  • Bosnia and Herzegovina
  • Botswana
  • Bouvet Island
  • Brazil
  • British Indian Ocean Territory
  • British Virgin Islands
  • Brunei
  • Bulgaria
  • Burkina Faso
  • Burundi
  • Cambodia
  • Cameroon
  • Canada
  • Cape Verde
  • Cayman Islands
  • Central African Republic
  • Chad
  • Chile
  • China
  • Christmas Island
  • Cocos (Keeling) Islands
  • Colombia
  • Comoros
  • Congo
  • Cook Islands
  • Costa Rica
  • Croatia
  • Cuba
  • Cyprus
  • Czech Republic
  • Democratic Republic of Congo
  • Denmark
  • Disputed Territory
  • Djibouti
  • Dominica
  • Dominican Republic
  • East Timor
  • Ecuador
  • Egypt
  • El Salvador
  • Equatorial Guinea
  • Eritrea
  • Estonia
  • Ethiopia
  • Falkland Islands
  • Faroe Islands
  • Federated States of Micronesia
  • Fiji
  • Finland
  • France
  • French Guyana
  • French Polynesia
  • French Southern Territories
  • Gabon
  • Gambia
  • Georgia
  • Germany
  • Ghana
  • Gibraltar
  • Greece
  • Greenland
  • Grenada
  • Guadeloupe
  • Guam
  • Guatemala
  • Guinea
  • Guinea-Bissau
  • Guyana
  • Haiti
  • Heard Island and Mcdonald Islands
  • Honduras
  • Hong Kong
  • Hungary
  • Iceland
  • India
  • Indonesia
  • Iran
  • Iraq
  • Iraq-Saudi Arabia Neutral Zone
  • Ireland
  • Israel
  • Italy
  • Ivory Coast
  • Jamaica
  • Japan
  • Jordan
  • Kazakhstan
  • Kenya
  • Kiribati
  • Kuwait
  • Kyrgyzstan
  • Laos
  • Latvia
  • Lebanon
  • Lesotho
  • Liberia
  • Libya
  • Liechtenstein
  • Lithuania
  • Luxembourg
  • Macau
  • Macedonia
  • Madagascar
  • Malawi
  • Malaysia
  • Maldives
  • Mali
  • Malta
  • Marshall Islands
  • Martinique
  • Mauritania
  • Mauritius
  • Mayotte
  • Mexico
  • Moldova
  • Monaco
  • Mongolia
  • Montenegro
  • Montserrat
  • Morocco
  • Mozambique
  • Myanmar
  • Namibia
  • Nauru
  • Nepal
  • Netherlands Antilles
  • Netherlands
  • New Caledonia
  • New Zealand
  • Nicaragua
  • Niger
  • Nigeria
  • Niue
  • Norfolk Island
  • North Korea
  • Northern Mariana Islands
  • Norway
  • Oman
  • Pakistan
  • Palau
  • Palestinian Territories
  • Panama
  • Papua New Guinea
  • Paraguay
  • Peru
  • Philippines
  • Pitcairn Islands
  • Poland
  • Portugal
  • Puerto Rico
  • Qatar
  • Reunion
  • Romania
  • Russia
  • Rwanda
  • Saint Helena and Dependencies
  • Saint Kitts and Nevis
  • Saint Lucia
  • Saint Pierre and Miquelon
  • Saint Vincent and the Grenadines
  • Samoa
  • San Marino
  • Sao Tome and Principe
  • Saudi Arabia
  • Senegal
  • Serbia
  • Seychelles
  • Sierra Leone
  • Singapore
  • Slovakia
  • Slovenia
  • Solomon Islands
  • Somalia
  • South Africa
  • South Georgia and South Sandwich Islands
  • South Korea
  • Spain
  • Spratly Islands
  • Sri Lanka
  • Sudan
  • Suriname
  • Svalbard and Jan Mayen
  • Swaziland
  • Sweden
  • Switzerland
  • Syria
  • Taiwan
  • Tajikistan
  • Tanzania
  • Thailand
  • Togo
  • Tokelau
  • Tonga
  • Trinidad and Tobago
  • Tunisia
  • Turkey
  • Turkmenistan
  • Turks And Caicos Islands
  • Tuvalu
  • US Virgin Islands
  • Uganda
  • Ukraine
  • United Arab Emirates
  • United Kingdom
  • United States
  • United States Minor Outlying Islands
  • Uruguay
  • Uzbekistan
  • Vanuatu
  • Vatican City
  • Venezuela
  • Vietnam
  • Wallis and Futuna
  • Western Sahara
  • Yemen
  • Zambia
  • Zimbabwe
Comments
I would like to join the mailing list to receive updates from Stanford Electronics.
Attach Drawing:
Drop files here or
Upload your File
Accepted file types: PDF, PNG, JPG, JPEG. Upload multiple files at once; Each file must be under 2MB.

E-mail address with your company's domain name is preferred. Otherwise, we may not be able to process your inquiry.

Please fill in the required fields.